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P04400 - SEMI P44 - Specification for Open Artwork System Interchange Standard (OASIS ®) Specific to Mask Tools StdPbc-0526 SEMI G66-96 (Reapproved 0823)

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Description

SEMI G66-96 (Reapproved 0823)

which is an intrinsic polarizer property

SEMI PV22 —Specification for Silicon Wafers for Use as Photovoltaic Solar Cells

This Test Method can be used to monitor or qualify photovoltaic (PV) silicon feedstock to be used in either crystalline or multicrystalline silicon wafer production

SEMI E142-0306 (technical revision)

P04400 - SEMI P44 - Specification for Open Artwork System Interchange Standard (OASIS ®) Specific to Mask Tools StdPbc-0526 SEMI G66-96 (Reapproved 0823)This Standard defines the common mask data format specifications based on OASIS for mask tools, namely OASIS. MASK. OASIS. MASK specification applies to the input data format for mask tools. Referenced SEMI Standards (purchase separately) SEMI P39 Specification for OASIS Open Artwork System Interchange Standard Revision History SEMI P44 1216 (Reapproved 0124) SEMI P44 1216 (technical revision) SEMI P44 0316 (technical revision) SEMI P44 0211

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